Description
SPARQ is the ideal instrument for characterizing multi-port devices common in signal integrity applications at a fraction of the cost of traditional methods.
It is ideal for:
• Development of measurement-based simulation models
• Design validation
• Compliance testing
• High-performance TDR
• PCB testing
• Portable measurement requirements
High-bandwidth, Multi-port
S-parameters for the Masses S-parameter measurements are most often produced by the vector network analyzer (VNA), a difficult instrument that is beyond many budgets. SPARQ is very affordable and simplifies measurements, making S-parameters accessible to all.
PC-based, Small and Portable
Traditional instruments that produce S-parameters are large and fundamentally stationary. The SPARQ, in contrast, is small, lightweight and portable. It connects to any standard PC through a USB 2.0 interface, allowing SPARQ to run where computing power is easily upgraded.
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