Anritsu MP1800A Signal Quality Analyzer Mainframe

Description

Anritsu MP1800A Signal Quality Analyzer
High Quality Instrument Provides Highly Accurate Results
Anritsu’s Signal Quality Analyzer (MP1800A) incorporates a Pulse Pattern Generator (PPG) module for generating the highest-quality, highest-amplitude signals in the industry, as well as an Error Detector (ED) module with the highest input sensitivity available.
The number of channels per MP1800A-series PPG or ED module can be selected from 1ch, 2ch or 4ch, supporting multichannel synchronization for up to 8 channels at 32 Gbit/s. As a result, each channel of AOC, CFP, CXP, QSFP+, etc., modules can be measured simultaneously, enabling crosstalk and skew tolerance evaluation tests.
The MP1800A PPG modules offer outputs up to 3.5 Vp-p, supporting the evaluation of modulators, such as EA and EML. In addition to generating IEEE and ITU-T burst and auxiliary signals for evaluating E-PON, G-PON, and 10GE-PON optical modules, the product’s automated generation of burst data and auxiliary signal output timings shortens evaluation times and improves evaluation quality.
Complete 32G Jitter Testing with Clock Recovery in One Box
Anritsu’s MP1800A with Low-Intrinsic Jitter PPG, 4TAP Emphasis, High-Sensitivity ED, Equalizer for Eye Opening compensation, and automatic measurement software is the ideal total solution for Jitter Tolerance tests.
Various types of jitter, such as SJ, RJ, BUJ, SSC can be generated using the built-in jitter modulation source. The Jitter Modulator generates wide-amplitude SJ up to 1 UI at a Jitter Frequency of 250 MHz, ensuring sufficient margin for receiver Jitter Tolerance tests. Additionally, the Intrinsic Jitter of 275 fs rms (nominal) is extremely low, not only when Jitter modulation is OFF but also when 0 UI is set at Jitter ON, ensuring accurate measurements even at low Jitter amplitudes.
Combining the MP1800A with the 4Tap Emphasis (MP1825B) supports the generation of pre-emphasis for high-speed interconnect standards up to 32.1 Gbit/s, such as CEI-28G, 32G Fibre Channel, and InfiniBand EDR (26G). Each tap can be changed independently assuring accurate pre-emphasis. Positioning the instrument as an external remote head, as close as possible to the DUT, minimizes the impact of signal degradation due to cable-loss and ISI, thus maintaining the highest signal quality at the DUT interface.

Features:
Highly expandable, plug-in, modular design bit error rate tester (BERT)
Bit Error Rate test from 0.1 Gbit/s to 32.1 Gbit/s; 64.2 Gbit/s with external MUX/DeMUX
Supports signal integrity analysis for a variety of 100G+ applications
High speed backplane and interconnect
High speed chip/device
Active optical cable
Optical transceiver modules
High-quality (12 ps rise/fall time) and low-jitter (8 ps p-p) PPG waveform, up to 3.5 Vp-p
Jitter tolerance test up to 32.1 Gbit/s
SJ up to 2000 UI. High modulation frequency SJ up to 1 UI at 250 MHz
Support generation of dual tone SJ, RJ, BUJ, and SSC
Half Period Jitter (Even/Odd Jitter)
Ultra high sensitivity Error Detector (10 mV typical) with embedded clock recovery
1 Tbit/s Next Gen. High-Speed Transmission Testing (32G x 32ch)